Growth and crystallographic feature-dependent characterization of spinel zinc ferrite thin films by RF sputtering
نویسندگان
چکیده
ZnFe2O4 (ZFO) thin films exhibiting varying crystallographic features ((222)-epitaxially, (400)-epitaxially, and randomly oriented films) were grown on various substrates by radio-frequency magnetron sputtering. The type of substrate used profoundly affected the surface topography of the resulting ZFO films. The surface of the ZFO (222) epilayer was dense and exhibited small rectangular surface grains; however, the ZFO (400) epilayer exhibited small grooves. The surface of the randomly oriented ZFO thin film exhibited distinct three-dimensional island-like grains that demonstrated considerable surface roughness. Magnetization-temperature curves revealed that the ZFO thin films exhibited a spin-glass transition temperature of approximately 40 K. The crystallographic orientation of the ZFO thin films strongly affected magnetic anisotropy. The ZFO (222) epitaxy exhibited the strongest magnetic anisotropy, whereas the randomly oriented ZFO thin film exhibited no clear magnetic anisotropy.
منابع مشابه
Correction: Growth and crystallographic feature-dependent characterization of spinel zinc ferrite thin films by RF sputtering
Correction Figure 4g in the original version of this article [1] was misused in the typesetting process. The figure 4g is the same as figure 4a. The corrected image for figure 4g is shown here (Figure 1). Reference 1. Liang YC, Hsia HY: Growth and crystallographic feature-dependent characterization of spinel zinc ferrite thin films by RF sputtering. Figure 1 Low-magnification TEM image of the Z...
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